Noncontact Atomic Force Microscopy (Nanoscience and Technology) (Hardcover)

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Noncontact Atomic Force Microscopy (Nanoscience and Technology) By S. Morita (Editor), Roland Wiesendanger (Editor), E. Meyer (Editor) Cover Image
By S. Morita (Editor), Roland Wiesendanger (Editor), E. Meyer (Editor)


Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
Product Details
ISBN: 9783540431176
ISBN-10: 3540431179
Publisher: Springer
Publication Date: July 24th, 2002
Pages: 440
Language: English
Series: Nanoscience and Technology